Attrezzature |
- 2 Renishaw micro-Raman spectrophotometers
- 1 Thermo Nicolet 5700 micro-FTIR
- 1 PerkinElmer LS 55 Fluorescence spectrometer
- 1 Bruker Atomic Force Microscope with scanning thermal analysis
- 1 aixxPES Piezo Evaluation System for characterization of piezoelectric composite or bulk ceramic samples
- 1 aixDBLI Double Beam Laser Interferometer for capacitance and piezocoefficient measurement
- 1 customized ellipsometer
- 1 Witec advanced SPM microscopy platform (Confocal Laser Scanning Microscopy, Atomic Force Microscopy, Scanning Near-field Optical Microscopy)
- Set-up for ultrafast optical spectroscopy: Spectra-PhysicsTunable pico-second tunable laser source, Acton spectrometer with Hamamatsu streak camera
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