Most recent publications

Busca, Roberta; Cimmino, Davide; Ferrero, Sergio; Scaltrito, Luciano; Pirri, Candido; ... (2020)
Multilayer film passivation for enhanced reliability of power semiconductor devices. In: JOURNAL OF VACUUM SCIENCE AND TECHNOLOGY. B, NANOTECHNOLOGY & MICROELECTRONICS, vol. 38. ISSN 2166-2746 Download fulltext
Cimmino, Davide; Busca, Roberta; Ferrero, Sergio; Pirri, Candido; Giovanni, Richieri; ... (2019)
High Voltage Temperature Humidity Bias Test (THB) customized system and methodologies for reliability assessment of power semiconductor devices. In: MICROELECTRONICS RELIABILITY, vol. 100-101, pp. 1-5. ISSN 0026-2714 Download fulltext
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