TEM Laboratory

Lab equipped with a Transmission Electron Microscope(TEM) TALOS F200X, produced by Thermo Scientific. This electron microscope, equipped with a field emission gun (XFEG) can perform morphological and compositional analysis of thin samples.
The microscope can be used in parallel beam mode (TEM mode), where it can be used to acquire Bright and Dard Field (BF/DF) images or high-resolution images (HRTEM) with magnifications up to about 1MX, using a 16Mpx CMOS sensor camera. Alternatively, the machine can work in convergent beam mode (STEM mode) where it can acquire as well images in BF/Df or in high angle annular dark field (HAADF). While in STEM mode, the machine can perform analytical investigation of samples using its optimized multi-quadrant energy dispersive X-rays detector (EDS) alternatively to, or combined with, the acquisition of electron energy loss spectroscopy (EELS) data by mean of its Gatan energy filter sytem, which allows the energy dispersion of transmitted electrons to be collected on its on-board 4 Mpx camera.
The machine can perform acquisition of series of images at different sample tilt angles to achieve 3D tomographic reconstruction of samples. It is moreover equipped with a special sample holder to load MEMS-type chips that allow to locally control sample temperature and/or apply a bias or perform multi-contact electrical measurements in-situ.